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Limitations and challenges in off-axis electron holography of electromagnetic fields in nanoscale materials

机译:纳米级材料中电磁场的离轴电子全息术的局限性和挑战

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摘要

In contrast to most conventional transmission electron microscopy (TEM) techniques, which only allow the spatial distribution of image intensity to be recorded, off-axis electron holography allows the phase shift of the electron wave that has passed through an electron-transparent specimen to be measured. The phase shift can, in turn, be used to provide information about local variations in magnetic induction and electrostatic potential within and around the specimen. Recent developments in the technique include the reconstruction of electrostatic potentials and magnetic fields in three dimensions, the use of advanced specimen holders with multiple electrical contacts to study nanoscale working devices, improvements in the stability of transmission electron microscopes to optimise phase sensitivity and the development of new approaches for improving temporal resolution using both direct electron detectors and double exposure electron holography. We are currently using the technique to characterize electrostatic potentials and magnetic fields in a wide variety of nanoparticles, nanostructures and thin films that are subjected to electrical biases and externally applied magnetic fields, as well as to elevated and reduced temperatures. Figure 1 shows representative results obtained from a study of the thermomagnetic behaviour of nanoscale grains of magnetite during heating in situ in the TEM. The magnetic induction maps show first a horseshoe-like magnetic state and then magnetic phase contours that flow from the bottom to top of the grain at higher temperature.An important limitation of backprojection-based algorithms for reconstructing magnetic fields in three dimensions is the presence of artefacts resulting from incomplete tilt series of phase images and the inability to include additional constraints and known physical laws. Accordingly, one of our aims is the development of a robust model-based approach that can be used to reconstruct the three-dimensional magnetization distribution in a specimen from phase images recorded as a function of specimen tilt angle using off-axis electron holography. In order to perform each reconstruction, we generate simulated magnetic induction maps by projecting best guesses for the three-dimensional magnetization distribution in the specimen onto two-dimensional Cartesian grids. Our simulations make use of known analytical solutions for the phase shifts of simple geometrical objects, with numerical discretization performed in real space to avoid artefacts generated by discretization in Fourier space, without a significant increase in computation time (Figs 2 and 3). Our forward simulation approach is used within an iterative model-based algorithm to solve the inverse problem of reconstructing the three-dimensional magnetization distribution in the specimen from tilt series of two-dimensional phase images recorded about two independent tilt axes. Results will be presented from studies of magnetite nanocrystals, lithographically patterned magnetic elements and magnetic skyrmions examined as a function of temperature and applied magnetic field. At the same time, we are developing a similar algorithm for the reconstruction of three-dimensional charge density distributions in materials. Preliminary results will be presented from studies of charge distributions in electrically biased needle-shaped specimens, which require the analysis of differences between phase images recorded using two applied voltages, in order to subtract the mean inner potential to the phase shift.The above studies are part of a wider program of research aimed at recording off-axis electron holograms of nanoscale materials and devices in the presence of multiple external stimuli. Further examples will be presented from studies of electrically biased resistive switching devices and two-dimensional flakes of transition metal dichalcogenides, whose electrical properties can be influenced strongly by the presence of contamination and defects, as well as by their interfaces to metal contacts. We are grateful to J. Ungermann, M. Riese, G. Pozzi, W. Williams, A. R. Muxworthy, M. Farle, M. Beleggia, T. F. Kelly and N. Kiselev for valuable contributions to this work and to the European Research Council for an Advanced Grant.
机译:与大多数传统的透射电子显微镜(TEM)技术仅允许记录图像强度的空间分布相反,离轴电子全息术允许通过电子透明样本的电子波的相移为测量。反过来,相移可用于提供有关样本内部和周围的磁感应和静电势的局部变化的信息。该技术的最新发展包括在三个维度上重建静电势和磁场,使用具有多个电触点的先进标本支架来研究纳米级工作装置,改进了透射电子显微镜的稳定性以优化相位灵敏度以及开发了电子显微镜。使用直接电子探测器和两次曝光电子全息术来改善时间分辨率的新方法。当前,我们正在使用该技术来表征各种纳米颗粒,纳米结构和薄膜中的静电势和磁场,这些纳米颗粒,纳米结构和薄膜会受到电偏压和外部施加的磁场以及升高和降低的温度的影响。图1显示了通过对TEM中原位加热过程中磁铁矿纳米级晶粒热磁行为的研究获得的代表性结果。磁感应图首先显示出类似马蹄形的磁态,然后显示出在高温下从谷粒的底部流向顶部的磁相轮廓。基于反投影的三维重建算法的一个重要局限性是存在由于相位图像的倾斜序列不完整以及无法包含其他限制条件和已知物理定律而导致的伪影。因此,我们的目标之一是开发一种基于模型的鲁棒方法,该方法可用于使用离轴电子全息图从记录为样品倾斜角函数的相位图像重建样品中的三维磁化分布。为了执行每个重建,我们通过将样本中三维磁化分布的最佳猜测投影到二维笛卡尔网格上,生成模拟的磁感应图。我们的仿真利用已知的解析解决方案来解决简单几何对象的相移问题,并在真实空间中执行数值离散化处理,从而避免了在傅立叶空间中离散化生成的伪影,而不会显着增加计算时间(图2和3)。我们在基于迭代模型的算法中使用了正向仿真方法,以解决从围绕两个独立的倾斜轴记录的二维相位图像的倾斜序列重建样本中三维磁化分布的逆问题。研究结果将根据磁铁矿纳米晶体,光刻图案化的磁性元素和作为温度和施加磁场的函数的磁性天生离子的研究结果提供。同时,我们正在开发一种类似的算法来重建材料中的三维电荷密度分布。将从电偏压针状样品中的电荷分布研究中获得初步结果,这需要分析使用两个外加电压记录的相图像之间的差异,以便减去相移的平均内部电势。该研究计划的一部分,旨在在存在多个外部刺激的情况下记录纳米级材料和设备的离轴电子全息图。将通过对电偏置电阻开关器件和过渡金属二卤化物的二维薄片的研究来提供更多示例,这些污染物的电性能会受到污染和缺陷的存在以及它们与金属触点的界面的强烈影响。我们感谢J. Ungermann,M。Riese,G。Pozzi,W。Williams,AR Muxworthy,M.Farle,M.Beleggia,TF Kelly和N.Kiselev为这项工作和欧洲研究理事会做出的宝贵贡献高级补助金。

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